SHOP FOR
MPI TS50 manual probe system
MPI TS50 Manual Probe Station

MPI TS50 | 50 mm Manual Probe System For accurate and reliable DC/CV and RF measurements

The MPI TS50 manual probe system has been specifically designed for IC Engineering, Single Die probing and academic use in DC/CV and RF measurement applications. The TS50 with the small footprint (300 x 300 mm) is engineered to its simplest form to allow convenient operation and providing quick set-up without compromising functionality and measurement capability.

MPI-AST-V20-001TS50 Fact Sheet

MPI-AST-V20-001TS50 Data Sheet


Flexible Platform
  • Designed for research, development and academic use in IC engineering, single die probing
  • Ideal platform for load pull and high frequency noise measurement
Ergonomic Design
  • Solid and stable platform in small footprint (300 x 300 mm) design
  • Rigid platen accommodates up to 6 DC or 2 RF positioners • Simple operation for stage and microscope positioning
Upgradability
  • Available with various chuck options and wide range of accessories such as DC/RF/mmW MicroPositioners, Optics, microscopes and EMI shielded dark box to support various application requirements
Features
  • Designed for research, development and academic use in IC engineering, single die probing
  • Microscope pivot XY movement
  • Supports DC/CV and RF measurements
  • 300 x 300 mm base plate designed for bench top use
  • Supports 2-port RF and up to 6 DC positioners
  • Dedicated probe arms for DC/CV and RF measurements
  • Including 25 x 25 mm fine micrometer control
  • Auxiliary chuck for calibration substrates
BrandMPI Corporation

No Review