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MPI TS2500-RF | 200 mm Fully Automated Probe System For RF Production Test Measurements

Designed for Wide Variety of RF On-Wafer Production Applications
  • RF applications up to 67 GHz & 4-port setup
  • Simutaneously for DC-IV / DC-CV / Pulsed-IV measurements

Production Reliability
  • Designed for 24/7 production reliability

Ergonomic Design and Options
  • Designed with easy single wafer front loading
  • Large Probe Platen supporting up to 4x RF MicroPositioners or standard 4.5” probe card holder
  • Dual end-effector and embedded pre-aligner for highest throughput
  • Available with various chuck options and wide range of accessories
  • Standard off-axis wafer alignment camera
  • Optional upper looking chuck camera for probe-to-pad alignment
  • Dedicated thin wafer handling option
Features
  • RF applications up to 67 GHz & 4-port setup
  • Simutaneously for DC-IV / DC-CV / Pulsed-IV measurements
  • Designed with easy single wafer front loading
  • Standard off-axis wafer alignment camera
  • Available with various chuck options and wide range of accessories
  • Dedicated thin wafer handling option
Brand MPI Corporation

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